Semiconductor device and a method of manufacturing the same

ABSTRACT

To reduce the size and improve the power added efficiency of an RF power module having an amplifier element composed of a silicon power MOSFET, the on resistance and feedback capacitance, which were conventionally in a trade-off relationship, are reduced simultaneously by forming the structure of an offset drain region existing between a gate electrode and an n +  type drain region of the power MOSFET into a double offset one. More specifically, this is accomplished by adjusting the impurity concentration of an n −  type offset drain region, which is closest to the gate electrode, to be relatively low and adjusting the impurity concentration of an n type offset drain region, which is distant from the gate electrode, to be relatively high.

CROSS-REFERENCE TO RELATED APPLICATION

The present application is a continuation of U.S. application Ser. No.12/823,453, filed Jun. 25, 2010, which, in turn, is a continuation ofU.S. application Ser. No. 11/645,577 filed Dec. 27, 2006 (now U.S. Pat.No. 7,791,131), which is a continuation of U.S. application Ser. No.10/902,130, filed Jul. 30, 2004 (now U.S. Pat. No. 7,176,520), whichclaims priority from Japanese Patent application JP2003-313971, filed onSep. 5, 2003, the contents of each of which are hereby incorporated byreference into this application.

BACKGROUND OF THE INVENTION

The present invention relates to a semiconductor device to be used formobile communication apparatuses (so called mobile phones) and to atechnique for the manufacture thereof, particularly to a technique thatis effective when applied to a semiconductor device to be mounted on anRF (Radio Frequency) power module.

In recent years, mobile communication apparatuses (so called mobilephones), which employ a communication system typified by GSM (GlobalSystem for Mobile Communications), PCS (Personal Communication Systems),PDC (Personal Digital Cellular) system or CDMA (Code Division MultipleAccess) system, have gained widespread use throughout the world.

In general, such mobile communication apparatuses are each composed ofan antenna for emitting and receiving electric waves, a high frequencypower amplifier for amplifying power-modulated high-frequency signalsand supplying them to the antenna, a receiver for processing highfrequency signals received by the antenna, a controller for controllingthem and a cell (battery) for supplying a power supply voltage.

Japanese Unexamined Patent Publication No. Hei 6(1994)-310717 (PatentDocument 1) discloses a technique for manufacturing a high voltageMOSFET having, on a drain side, a heavily doped drain region via alightly doped offset drain region. The improvement is constituted by thefact that an impurity is ion-implanted into the sidewalls of a gateelectrode twice, that is, before and after formation of sidewallspacers, to give an LDD (Lightly Doped Drain) structure to a source.

U.S. Pat. No. 6,020,611 discloses a technique for the manufacture of ahigh voltage MOSFET having, on a drain side, a highly doped drain regionvia a lightly doped offset drain region. The improvement here isconstituted by the fact that a third drain region is formed between thelightly doped offset drain region and the highly doped drain region bytwice performing ion implantation using photoresist films havingdifferent patterns as masks.

-   [Patent Document 1] Japanese Unexamined Patent Publication No. Hei    6(1994)-310717-   [Patent Document 2] U.S. Pat. No. 6,020,611

SUMMARY OF THE INVENTION

As an amplifying element to be used for the power amplifier circuit of amobile communication apparatus, compound semiconductor devices, siliconbipolar transistors, and silicon power insulated gate field effecttransistors (which will hereinafter be called power MOSFETs) have beenused, depending on the purpose of use or the environment.

Of these, power MOSFETs are amplifying elements having a structure inwhich a drain is maintained at a high breakdown voltage by disposing, ona drain side, a heavily doped drain region via a lightly doped offsetdrain region. These elements are advantageous over compoundsemiconductor devices in providing easy bias control and high massproductivity, in spite of their inferiority in power added efficiency.

Owing to a recent rise in the amount of power consumption of a mobilecommunication apparatus that has occurred with an increase in the numberof its parts, each part must satisfy the requirements for size reductionand the ability to operate at a lower power. Power amplifier circuitsconsume a particularly large power among the various parts, so that areduction in the chip size and operation at a lower power are stronglydemanded.

Accordingly, one of the problems of a semiconductor device for a mobilecommunication apparatus which uses a power MOSFET as an amplifyingelement is to improve the power added efficiency of an amplifier circuitusing a power MOSFET. Another problem is to promote a size reduction ofthe chip on which a power MOSFET serving as an amplifying element isformed.

Improvement of the power added efficiency of an amplifying circuit canbe attained by a reduction in the on resistance (Ron) of the powerMOSFET and, at the same time, a reduction in the parasitic capacitancebetween the drain and gate, which is called a feedback capacitance(Cgd). There is however, a trade-off relationship between the onresistance (Ron) and the feedback capacitance (Cgd) of a power MOSFET.An increase in the impurity concentration of an offset drain region iseffective for reducing the on resistance (Ron) of the power MOSFET.However, this inevitably increases the feedback capacitance (Cgd), whichis a parasitic capacitance formed between the drain and gate, and lowersthe power added efficiency of an amplifier circuit. It is thereforenecessary to develop a technique that is capable of reducing both the onresistance (Ron and the feedback capacitance (Cgd) in order to improvethe power added efficiency of a power MOSFET.

An object of the present invention is to provide a technique forimproving the power added efficiency of a semiconductor device for usein mobile communication apparatuses.

Another object of the present invention is to provide a technique forpromoting a reduction in chip size of a semiconductor device for mobilecommunication apparatuses.

The above-described and other objects and novel features of the presentinvention will be apparent from the following description herein andaccompanying drawings.

Of the various aspects and features of the present invention disclosedin the present application, the representative ones will be outlinedbelow.

In one aspect of the present invention, there is provided asemiconductor device having an MOSFET, which comprises: a source and adrain of a second conductivity type formed over a portion of the mainsurface of a semiconductor substrate of a first conductivity type whilebeing spaced apart by a channel formation region therebetween; a gateelectrode formed over the channel formation region via a gate insulatingfilm; sidewall spacers formed over the sidewalls of the gate electrode;and a sinker layer of the first conductivity type which is formed overanother portion of the main surface of the semiconductor substrate andis in contact with the source.

The drain of the MOSFET comprises a lightly doped region of the secondconductivity type, and a heavily doped region of the second conductivitytype formed in contact with the lightly doped region and spaced apartfrom the channel formation region; and, the lightly doped region furthercomprises a first lightly doped region, which is in contact with thechannel formation region, and a second lightly doped region formed inself alignment with the sidewall spacers and having an impurityconcentration which is higher than that of the first lightly dopedregion.

In another aspect of the present invention, there is also provided asemiconductor device having an MOSFET, which comprises: a source and adrain of a second conductivity type which are formed over a portion ofthe main surface of a semiconductor substrate of a first conductivitytype while being spaced apart by a channel formation region interposedbetween the source and drain; a gate electrode formed over the channelformation region via a gate insulating film; and a plurality of sinkerlayers of a first conductivity type which are formed over other portionsof the main surface of the semiconductor substrate to be brought incontact with the source.

The source and the drain have finger-shaped plane patterns extendingparallel to each other along a first direction of the main surface ofthe semiconductor substrate; and, the plurality of sinker layers arearranged along the first direction, and the sinker layers each have arectangular plane pattern such that the longer side thereof is parallelto a second direction intersecting with the first direction.

In a further aspect of the present invention, there is also provided asemiconductor device, which comprises: a source and a drain of a secondconductivity type formed in a first region of the main surface of asemiconductor substrate while being spaced by a channel formation regioninterposed between the source and drain; a gate electrode formed of apolysilicon film over the channel formation region via a gate insulatingfilm; a cap insulating film covering the upper portion of the gateelectrode; a stopper insulating film covering the upper portion of thecap insulating film and being different in etching rate from that of thecap insulating film; and an interlayer insulating film covering theupper portion of the stopper insulating film.

A trench penetrating through the interlayer insulating film, stopperinsulating film and cap insulating film and reaching the surface of thegate electrode is formed over the gate electrode, and a conductive filmhaving a smaller electric resistance than that of the polysilicon filmis embedded in the trench.

In a still further aspect of the present invention, there is alsoprovided a method of manufacture of a semiconductor device, whichcomprises the steps of forming a gate electrode over the main surface ofa semiconductor substrate of a first conductivity type via a gateinsulating film, and ion-implanting an impurity into the semiconductorsubstrate on both sides of the gate electrode to form a source anddrain. The drain forming step further comprises the sub-steps of:

(a) ion-implanting an impurity into a drain formation region of thesemiconductor substrate and thereby forming a first lightly doped regionof a second conductivity type extending, at one end thereof, below thesidewalls of the gate electrode;

(b) after the step (a), forming sidewall spacers over the sidewalls ofthe gate electrode;

(c) after the step (b), ion-implanting an impurity into a drainformation region of the semiconductor substrate and thereby forming asecond lightly doped region of a second conductivity type, which has ahigher impurity concentration than that of the first lightly dopedregion, in self alignment with the sidewall spacers; and

(d) ion-implanting an impurity into a portion of the second lightlydoped region and thereby forming a heavily doped region of the secondconductivity type which has a higher impurity concentration than that ofthe second lightly doped region and is, at one end thereof, spaced fromthe lower portion of the sidewalls of the gate electrode.

Advantages available by typical features of the invention disclosed inthe present application will be described briefly.

The present invention makes it possible to reduce both the on resistance(Ron) and the feedback capacitance (Cgd) of a power MOSFET, leading toan improvement in the power added efficiency of a semiconductor devicefor mobile communication apparatuses.

By shunting the gate electrode with a low-resistance plug made of ametal film embedded in a trench formed over the gate electrode of apower MOSFET and thereby reducing its sheet resistance, the provision ofan Al alloy wiring region for a shunt becomes unnecessary, and the sizeof a semiconductor chip on which the power MOSFET is to be formed can bereduced.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of an amplifier circuit according to oneembodiment of the present invention;

FIG. 2 is a fragmentary cross-sectional view illustrating asemiconductor device of the present invention;

FIG. 3 is a fragmentary cross-sectional view illustrating thesemiconductor device of the present invention during its manufacturingstep;

FIG. 4 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.3;

FIG. 5 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.4;

FIG. 6 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.5;

FIG. 7 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.6;

FIG. 8 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.7;

FIG. 9 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.8;

FIG. 10 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.9;

FIG. 11 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.10;

FIG. 12 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.11;

FIG. 13 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.12;

FIG. 14 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.13;

FIG. 15 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.14;

FIG. 16 is a fragmentary cross-sectional view illustrating thesemiconductor device during a manufacturing step following that of FIG.15;

FIG. 17 is a table showing a comparison between the structure of thepresent invention and a conventional structure in on resistance (Ron)and feedback capacitance (Cgd);

FIG. 18 is a graph showing a comparison between the structure of thepresent invention and the conventional structure in power addedefficiency when a sinusoidal signal having a frequency of 900 MHz isinput;

FIG. 19 is a diagrammatic perspective view illustrating an RF powermodule having an amplifier circuit according to one embodiment of thepresent invention;

FIG. 20 is a plan view illustrating a plane layout of rectangular sinkerlayers having the width of one side fixed;

FIG. 21 is a plan view illustrating a layout of rectangular sinkerlayers forming an X-shaped or T-shaped intersection;

FIG. 22 is a plan view illustrating a layout of rectangular sinkerlayers arranged so that their longitudinal direction is parallel to thelongitudinal direction of the finger;

FIG. 23 is a plan view illustrating a layout of rectangular sinkerlayers arranged so that their longitudinal direction is vertical to thelongitudinal direction of the finger;

FIG. 24 is a graph for comparing the area of the rectangular sinkerlayer between the rectangular sinker layers arranged in parallel and therectangular sinker layers arranged vertical, each relative to thelongitudinal direction of the finger;

FIG. 25 is a plan view illustrating the layout of the sinker layersarranged in a meander form;

FIG. 26 is a plan view illustrating the layout of the sinker layersarranged in a mesh form; and

FIG. 27 is a fragmentary cross-sectional view of the semiconductordevice of the present invention in which a gate electrode has beenshunted with a plug.

DETAILED DESCRIPTION OF THE INVENTION

Embodiments of the present invention will be described hereinafter morespecifically with reference to the accompanying drawings. In all of thedrawings, elements having like function will be identified by likereference numerals, and overlapping descriptions thereof will beomitted.

In the following description, reference will be made to features of theinvention after the subject matter of the invention is divided in pluralsections or in plural embodiments if necessary for convenience's sake.These plural sections or embodiments are not independent of each other,but are in a relation such that one is a modification, representsdetails or is a complementary description of a part or whole of theother one, unless otherwise specifically indicated. In the followingdescription, when reference is made to a number of elements (including anumber, value, amount and range), the number of elements is not limitedto a specific number, but can be greater than or less than the specificnumber, unless otherwise specifically indicated, or in the case it isprincipally apparent that the number is limited to the specific number.

Moreover, in the description of the embodiments, it is needless to saythat the constituting elements (including element steps) are not alwaysessential, unless otherwise specifically indicated, or in the case whereit is principally apparent that they are essential.

Similarly, in the following description of the embodiments, whenreference is made to the shape or positional relationship ofconstituting elements, a shape or positional relationship substantiallyanalogous or similar to it is also embraced, unless otherwisespecifically indicated, or in the case where it is utterly different inprinciple. This also applies to the above-described value and range.

Embodiment 1

Embodiment 1 is a semiconductor device mounted on an RF (RadioFrequency) power module to be used for a digital mobile phone whichtransmits data by making use of, for example, a GSM system network.

FIG. 1 is a block diagram of an amplifier circuit which constitutes theRF power module of Embodiment 1. In this diagram, there is illustratedan amplifier circuit to be used for an RF power module for which twofrequency bands, for example, GSM900 and DCS1800, can be used (dual bandsystem); and, at each frequency band, two communication systems, thatis, a GMSK (Gaussian filtered Minimum Shift Keying) modulation systemand an EDGE (Enhanced Data GSM Environment) modulation system, can beused.

The amplifier circuit has a power amplifier circuit 102A for GSM900, apower amplifier circuit 102B for DCS1800, and a peripheral circuit 103which controls or assists the amplifying operation of each of the poweramplifier circuits 102A and 102B. The power amplifier circuits 102A and102B each have three amplifier stages 102A1 to 102A3 and 102B1 to 102B3,respectively, and three matching circuits 102AM1 to 102AM3 and 102BM1 to102BM3, respectively. More specifically, input terminals 104 a and 104 bare electrically connected to the inputs of the first-stage amplifierstages 102A1 and 102B1 via matching circuits 102AM1 and 102BM1 forinput, respectively; the outputs of the first-stage amplifier stages102A1 and 102B1 are electrically connected to the inputs of thesecond-stage amplifier stages 102A2 and 102B2 via interstage matchingcircuits 102AM2 and 102BM2, respectively; the outputs of thesecond-stage amplifier stages 102A2 and 102B2 are electrically connectedto the inputs of the final-stage amplifier stages 102A3 and 102B3 viainterstage matching circuits 102AM3 and 102BM3, respectively; and theoutputs of the final-stage amplifier stages 102A3 and 102B3 areelectrically connected to the output terminals 105 a and 105 b,respectively.

The peripheral circuit 103 has a control circuit 103A, and it also has abias circuit 103B for applying a bias voltage to the above-describedamplifier stages 102A1 to 102A3 and 102B1 to 102B3. The control circuit103A is a circuit that is used for generating a desired voltage to beapplied to the above-described power amplifier circuits 102A and 102B,and it has a power control circuit 103A1 and a bias voltage generatorcircuit 103A2. The power control circuit 103A1 is a circuit used forgenerating a first power voltage to be applied to drain terminals of apower MOSFET for outputs of the amplifier stages 102A1 to 102A3 and102B1 to 102B3. The bias voltage generator circuit 103A2 is a circuitused for generating a first control voltage to be applied to control thebias circuit 103B. When the power control circuit 103A1 generates thefirst power voltage in accordance with an output level indicating signalsupplied from a base band circuit outside, the bias voltage generatorcircuit 103A2 generates the first control voltage based on the firstpower voltage generated by the power control circuit 103A1. The baseband circuit is a circuit used for generating the output levelindicating signal. This output level indicating signal is a signalindicating the output levels of the power amplifier circuits 102A and102B, and they are generated based on the distance between a mobilephone and a base station thereof, that is, an output level according tothe intensity of the electric waves.

The power amplifier circuits 102A and 102B have a circuit constitutionhaving three n channel type power MOSFETs cascade-connected successivelyas the three amplifying stages 102A1 to 102A3 and 102B1 to 102B3,respectively.

FIG. 2 is a fragmentary cross-sectional view of a semiconductorsubstrate 1 having the power amplifier circuits 102A and 102B formedthereon.

Over the main surface of the semiconductor substrate (a semiconductorsubstrate with a first conductivity type, which will hereinafter simplybe called a “substrate”) 1 having a specific resistance of about 5 mΩcmand which is made of p type single crystal silicon, an epitaxial layer 2made of p type single crystal silicon having a specific resistance ofabout 20 Ωcm and a film thickness of about 2 μm is formed. In a portionof the main surface of the epitaxial layer 2, a p well 5 is formed. Thisp well 5 functions as a punch-through stopper, which inhibits extensionof a depletion layer from the drain to the source of the power MOSFET.

Over the surface of the p well 5, a gate electrode 7 of the power MOSFETis formed via a gate insulating film 6 made of silicon oxide. The gateelectrode 7 is composed of a film stack, for example, of an n typepolysilicon film and a tungsten silicide (WSi_(x)) film. The p well 5below the gate electrode 7 will constitute a formation region of achannel of the power MOSFET. Over the sidewalls of the gate electrode 7,sidewall spacers 12 made of silicon oxide are formed.

In regions inside the epitaxial layer 2, which are separated from eachother with a channel formation region inserted therebetween, a sourceand a drain of the power MOSFET are formed. The drain has an n⁻ typeoffset drain region (first lightly doped region) 9 which is in contactwith the channel formation region; an n type offset drain region (secondlightly doped region) 13 which is in contact with the n⁻ type offsetdrain region 9 and is spaced from the channel formation region; and ann⁺ type drain region (highly doped offset region) 15 which is in contactwith the n type offset drain region 13 and spaced further from thechannel formation region. Among the n⁻ type offset drain region 9, ntype offset drain region 13 and n⁺ type drain region 15, the n⁻ typeoffset drain region 9 which is closest to the gate electrode 7 has thelowest impurity concentration, while the n⁺ drain region 15 which ismost distant from the gate electrode has the highest impurityconcentration. As described later, the n⁻ type offset drain region 9 isformed in self alignment with the gate electrode 7, while the n typeoffset drain region 13 is formed in self alignment with the sidewallspacers 12 over the sidewalls of the gate electrode 7.

As described above, the power MOSFET of this Embodiment is characterizedby the fact that an offset drain region existing between the gateelectrode 7 and the n⁺ type drain region 15 is endowed with a doubleoffset structure by adjusting the impurity concentration of the n⁻ typeoffset drain region 9 closest to the gate electrode 7 to a relativelylow level, while that of the n type offset drain region 13 most distantfrom the gate electrode 7 is adjusted to be relatively high.

Owing to the above-described structure, a depletion layer extendsbetween the gate electrode 7 and the drain, resulting in a reduction inthe feedback capacitance (Cgd) formed between the gate electrode 7 andthe n⁻ type offset drain region 9 in the vicinity thereof. In addition,owing to a high impurity concentration of the n type offset drain region13, the on resistance (Ron) decreases. Since the n type offset drainregion 13 is formed at a position distant from the gate electrode 7, itsinfluence on the feedback capacitance (Cgd) is negligible. In otherwords, according to the power MOSFET of this Embodiment, the onresistance (Ron) and feedback capacitance (Cgd), which were in atrade-off relationship in the conventional power MOSFET, can be reducedsimultaneously, making it possible to improve the power added efficiencyof an amplifier circuit.

The source of the power MOSFET has an n⁻ type source region (lightlydoped region) 10 in contact with the channel formation region, and an n⁺type source region (heavily doped region) 16 that is in contact with then⁻ type source region 10 and is spaced from the channel formationregion. The n⁻ type source region 10 in contact with the channelformation region has a lower impurity concentration and has a shallowerdepth, compared with the n⁺ type source region 16 that is spaced fromthe channel formation region. Below the n⁻ type source region 10, a ptype halo region 11 is formed in order to suppress extension of animpurity from the source to the channel formation region and, moreover,to suppress a short channel effect. As described later, the n⁻ typesource region 10 is formed in self alignment with the gate electrode 7,while the n⁺ type source region 16 is formed in self alignment with thesidewall spacers 12 over the sidewalls of the gate electrode 7.

At the end (end opposite to a side to be brought into contact with then⁻ type source region 10) of the n⁺ type source region 16, a p typesinker layer 4 is formed in contact with the n⁺ type source region 16.In the vicinity of the surface of this p type sinker layer 4, a p⁺ typesemiconductor region 17 for reducing the resistance of the surface ofthe p type sinker layer 4. The p type sinker layer 4 is a conductivelayer for connecting the source to the substrate 1. One of thecharacteristics of the power MOSFET of this Embodiment resides in thefact that the p type sinker layer 4 is formed of a conductive layer madeof a p type polysilicon film embedded in a trench 3 formed in theepitaxial layer 2.

In the conventional power MOSFET, a sinker layer is formed byion-implanting an impurity into the epitaxial layer 2. Although the ptype sinker layer that is formed by ion implantation is disadvantageousin that it has an excessively large parasitic resistance per unit area,the p type sinker layer 4 having a small parasitic resistance can beformed by embedding the trench 3 with a heavily doped p type polysiliconfilm.

A plug 23 in a contact hole 22, which is formed in a silicon nitridefilm 20 and a silicon oxide film 21, is connected to the upper portionof each of the p type sinker layer 4 (p⁺ type semiconductor region 17),the source (n⁺ type source region 16) and drain (n⁺ type offset drainregion 15). The plug 23 is made of a conductive film composed mainly ofa W film.

To the p type sinker layer 4 (p⁺ type semiconductor region 17) andsource (n⁺ type source region 16), a source electrode 25 is connectedvia the plug 23; while, to the drain (n⁺ type offset drain region 15), adrain electrode 24 is connected via the plug 23. The source electrode 25and drain electrode 24 are each formed of a conductive film composedmainly of an aluminum (Al) alloy film.

To the drain electrode 24 and source electrode 25, interconnects 28 areconnected via through-holes 27 formed in a silicon oxide film 26covering the drain electrode 24 and source electrode 25, respectively.The interconnect 28 is formed of a conductive film composed mainly of analuminum (Al) alloy film. Over the interconnect 28, a surface protectivefilm 29, composed of a film stack consisting of a silicon oxide film anda silicon nitride film, is formed. Over the backside of the substrate 1,a source rear electrode 31, made of a film stack consisting of, forexample, a nickel (Ni) film, a titanium (Ti) film, Ni film and gold (Au)film, is formed.

A method of manufacture of the power MOSFET illustrated in FIG. 2 willbe described next with reference to FIGS. 3 to 16 in the order of thesteps thereof.

As illustrated in FIG. 3, after formation of an epitaxial layer 2, whichis made of p type single crystal silicon, over the main surface of thesubstrate 1, which is made of p type single crystal silicon, by using aknown epitaxial growth method, a portion (a sinker layer formationregion) of the epitaxial layer 2 is etched by conventionalphotolithography and dry etching, whereby a trench 3 having a depth ofabout 2.2 μm and reaching the substrate 1 is formed.

As illustrated in FIG. 4, after deposition of a p type polysilicon film30 over the substrate 1, including the inside of the trench 3, by CVD,the polysilicon film 30 outside the trench 3 is removed by etchback,whereby a p type sinker layer 4 made of the p type polysilicon film 30is formed inside of the trench 3. By embedding the inside of the trench3 with the impurity-doped p type polysilicon film 3 in such a manner,the p type sinker layer 4 having a small parasitic resistance can beformed. Instead of the polysilicon film, a metal film can be embeddedinside of the trench 3 to form a sinker layer having a smaller parasiticresistance.

As illustrated in FIG. 5, a p well 5 serving as a punch-through stopperis formed by ion-implanting boron (B) into a portion of the epitaxiallayer 2 using a photoresist film 40 as a mask. The p well 5 is formedmainly in the source formation region and channel formation region ofthe power MOSFET. Ion implantation is effected twice under the followingconditions: first, at an acceleration energy of 200 keV and a dosage of2.0×10¹³ /cm², and, second, at an acceleration energy of 50 keV and adosage of 1.0×10¹³/cm²

After washing the surface of the epitaxial layer 2 with hydrofluoricacid, the substrate 1 is heat treated at about 800° C. to form a gateinsulating film 6 made of a silicon oxide film and having a thickness ofabout 11 nm over the surface of the epitaxial layer 2, as illustrated inFIG. 6. As the gate insulating film 6, the thermal oxide film may bereplaced with a silicon oxide film containing nitrogen, i.e. a so-calledoxynitride film. In this case, trapping of hot electrons on theinterface of the gate insulating film 6 can be reduced. Alternatively,the gate insulating film 6 may be formed from a two-layer oxide filmobtained by depositing a silicon oxide film over the thermal oxide filmby CVD.

A gate electrode 7 is then formed over the gate insulating film 6. Thisgate electrode 7 is formed, for example, by depositing an n typepolysilicon film having a thickness of about 100 nm over the gateinsulating film 6 by CVD, depositing a WSi_(x) film having a thicknessof 150 nm over the n type polysilicon film by CVD, depositing a capinsulating film 8 made of a silicon oxide film having a thickness of 150nm over the WSi_(x) film by CVD, and then dry etching the cap insulatingfilm 8, WSi_(x) film and n type polysilicon film using a photoresistfilm as a mask. The gate electrode 7 has a gate length of about 0.23 μm.

As illustrated in FIG. 7, an n⁻ type offset drain region 9 is thenformed by ion-implanting phosphorus (P) into a portion of the epitaxiallayer 2 using a photoresist film 41 as a mask. This n⁻ type offset drainregion 9 has its ends below the sidewalls of the gate electrode 7 sothat each end is brought into contact with the channel formation region.Ion implantation for the formation of the n⁻ type offset drain region 9is conducted under the conditions, for example, of an accelerationenergy of 40 keV and a dosage of 8.0×10¹² /cm². By lowering the impurityconcentration of the n⁻ type offset drain region 9, a depletion layerextends between the gate electrode 7 and drain, leading to a reductionin the feedback capacitance (Cgd) formed therebetween.

After removal of the photoresist film 41, an n⁻ type source region 10 isformed by ion-implanting arsenic (As) into the surface of the p well 5using a photoresist film 42 as a mask, as illustrated in FIG. 8. Ionimplantation is conducted under the conditions, for example, of anacceleration energy of 15 keV and a dosage of 3.0×10¹⁵ /cm². By ionimplantation of an impurity (As) at a low acceleration energy andformation of the n⁻ type source region 10 with a shallow depth,extension of the impurity from the source toward the channel formationregion can be controlled, leading to suppression in a lowering of thethreshold voltage.

Following the ion implantation of an impurity (As), boron (B) ision-implanted into the surface of the p well 5 using the photoresistfilm 42 as a mask, whereby a p type halo region 11 is formed below then⁻ type source region 10. For this ion implantation, tilt-angle ionimplantation in which an impurity is ion-implanted at a tilt angle of30° relative to the main surface of the substrate 1 is employed. Forexample, after ion implantation of an impurity at an acceleration energyof 15 keV and a dosage of 7.0×10¹² /cm², a 90° rotation of the substrate1 is repeated four times. The formation of the p type halo region 11 isnot always necessary, but it contributes to further suppression in theextension of the impurity from the source toward the channel formationregion, and it also contributes to further suppression in short channeleffects so that a lowering of the threshold voltage can be suppressedfurther.

After removal of the photoresist film 42, sidewall spacers 12 are formedover the sidewalls of the gate electrode 7, as illustrated in FIG. 10.The sidewall spacers 12 are formed by depositing a silicon oxide filmover the substrate 1 by CVD, followed by anisotropic etching of thissilicon oxide film. As the silicon oxide film for the sidewall spacers12, an HLD (High Temperature Low Pressure Decomposition) film obtainedby thermal decomposition of TEOS (tetraethyl orthosilicate), which is anorganic source, is employed. This HLD film features excellent uniformityin thickness and difficulty in diffusion of an impurity therein.

As illustrated in FIG. 11, using a photoresist film 43 having an openingover the drain formation region as a mask, phosphorus (P) ision-implanted into a portion of the n⁻ type offset drain region 9. Thision implantation is effected, for example, under the conditions of anacceleration energy of 40 keV and a dosage of 8.0×10¹² /cm². By this ionimplantation, an n type offset drain region 13 is formed in selfalignment with the sidewall spacers 12 that are formed over thesidewalls, on the drain side, of the gate electrodes 7.

The acceleration energy of this ion implantation is equal to that of theion implantation for the formation of the n⁻ type offset drain region 9,so that the junction depth of the n type offset drain region 13 isalmost equal to that of the n⁻ type offset drain region 9. In addition,the impurity (P) implanted into the n type offset drain region 13 hasthe same conductivity type as that implanted into the n⁻ type offsetdrain region 9, so that the impurity concentration of the n type offsetdrain region 13 becomes higher than that of the n⁻ type offset drainregion 9. In other words, the resistance of the n type offset drainregion 13 becomes lower than that of the n⁻ type offset drain region 9,so that the on resistance (Ron) can be reduced.

The n⁻ type offset drain region 9 is formed in self alignment with thegate electrode 7, while the n type offset drain region 13 is formed inself alignment with the sidewall spacers 12 on the sidewalls of the gateelectrode 7, so that the n type offset drain region 13 is spaced fromthe gate electrode 7 by a distance corresponding to the thickness of thesidewall spacers 12 extending along the gate length direction.Therefore, even an increase in the impurity concentration in the n typeoffset drain region 13 has only a slight influence on the feedbackcapacitance (Cgd).

After removal of the photoresist film 43, with a photoresist film 44having an opening over each of a portion of the n type offset drainregion 13 and the p well 5 of the source formation region, arsenic (As)is ion-implanted into the above-described portion of each of the n typeoffset drain region 13 and p well 5, as illustrated in FIG. 12. This ionimplantation is effected, for example, under the conditions of anacceleration energy of 60 keV and a dosage of 8.0×10¹⁵ /cm².

By the above-described ion implantation, an n⁺ type drain region 15having a higher impurity concentration than that of the n type offsetdrain region 13 and which is more distant from the channel formationregion than the n type offset drain region 13 is formed in a portion ofthe n type offset drain region 13. At this time, by forming the highlydoped n⁺ type drain region 15 with a smaller thickness than that of thelightly-doped n type offset drain region 13 or n⁻ type offset drainregion 9, a parasitic capacitance (drain capacitance) between source anddrain can be reduced.

By the above-described ion implantation, an n⁺ type source region 16having a higher impurity concentration than that of the n⁻ type sourceregion 10, and which has a bottom position deeper than that of the n⁻type source region 10, is also formed in the p well 5. This n⁺ typesource region 16 is formed in self alignment with the sidewall spacers12 over the sidewalls of the gate electrode 7, so that it is separatedfrom the channel formation region by a distance corresponding to thethickness of the sidewall spacers 12 extending along the gate lengthdirection.

By the formation of the n⁺ type source region 16 in self alignment withthe sidewall spacers 12, as described above, the distance between the n⁺type source region 16 and the channel formation region can be definedwith high accuracy. If the n⁺ type source region 16 is spaced from thechannel formation region by ion implantation using a photoresist film asa mask without forming sidewall spacers 12 over the sidewalls of thegate electrode 7, misalignment of the photomask causes variations in thedistance between the n⁺ type source region 16 and the channel formationregion. In this case, if the end portion of the n⁺ type source region 16comes too close to the channel formation region, the impurity in the n⁺type source region 16 diffuses in the channel formation region, causingvariations in the threshold voltage. Too long a distance between the endportion of the n⁺ type source region 16 and channel formation region, onthe other hand, increases the source resistance.

According to this Embodiment, in which the n⁺ type source region 16 isformed in self alignment with the sidewall spacers 12, problems asdescribed above can be avoided even if the power MOSFET is miniaturized.It is therefore possible to promote miniaturization of the power MOSFET.

By the steps so far described, a power MOSFET having a drain composed ofan n⁻ type offset drain region 9, an n type offset drain region 13 andan n⁺ type drain region 15, and a source composed of an n⁻ type sourceregion 10 and an n⁺ type source region 16 is completed.

After removal of the photoresist film 44, using as a mask a photoresistfilm 45 having an opening over the p type sinker layer 4, boron fluoride(BF₂) is ion-implanted into the surface of the p type sinker layer 4,whereby a p⁺ type semiconductor region 17 is formed and the resistanceof the surface of the p type sinker layer 4 is lowered. Ion implantationis effected, for example, under the conditions of an acceleration energyof 50 keV and a dosage of 2.0×10¹⁵ cm².

After removal of the photoresist film 45, as illustrated in FIG. 14,contact holes 22 are formed over the p type sinker layer 4 (p⁺ typesemiconductor region 17), the source (n⁺ type source region 16) and thedrain (n⁺ type drain region 15), respectively, by depositing a siliconnitride film 20 having a thickness of about 50 nm and a silicon oxidefilm 21 having a thickness of about 800 nm over the substrate 1 by CVD,planarizing the surface of the silicon oxide film 21 by chemicalmechanical polishing, and dry etching the silicon oxide film 21 andsilicon nitride film 20 using a photoresist film as a mask.

As illustrated in FIG. 15, a plug 23 composed mainly of a W film isburied inside of each of the contact holes 22, followed by theformation, over the silicon oxide film 21, of a drain electrode 24 and asource electrode 25 composed mainly of an aluminum (Al) alloy film.

As illustrated in FIG. 16, a silicon oxide film 26 having a thickness ofabout 900 nm is deposited over the drain electrode 24 and sourceelectrode 25 by CVD, and, then, a through-hole 27 is formed by etching aportion of the silicon oxide film 26. Then, an interconnect 28 composedmainly of an aluminum (Al) alloy film is formed over the silicon oxidefilm 26 to connect the interconnect 28 and the drain electrode 24, andthe interconnect 28 and the source electrode 25, respectively. Over theinterconnect 28, a surface protective film 29 is then formed using asilicon oxide film having a thickness of about 300 nm and a siliconnitride film having a thickness of about 500 nm by CVD.

After a portion of the surface protective film 29 is selectively removedto expose a portion of the interconnect 28 (a pad portion notillustrated in FIG. 16), the back surface of the substrate 1 is polishedby about 280 nm, and, then, a source rear electrode 31 is formed on theback surface of the substrate 1. By the steps so far described, thepower amplifier circuit as illustrated in FIG. 2 is substantiallycompleted. The source rear electrode 31 is formed, for example, bysuccessively depositing a nickel (Ni) film having a thickness of about0.1 μm, a titanium (Ti) film having a thickness of about 0.15 μm, an Nifilm having a thickness of about 0.1 μm and a gold (Au) film having athickness of about 1.3 μm by sputtering. The substrate 1 is separatedinto individual semiconductor chip, which are then soldered onto amodule substrate via the source rear electrode 31.

FIG. 17 shows comparison in the feedback capacitance (Cgd) and onresistance (Ron) between the power MOSFET of this Embodiment and theconventional power MOSFET. In the former one, the offset drain regionexisting between the gate electrode 7 and the n⁺ type drain region 15has a double offset structure; more specifically, the n⁻ type offsetdrain region 9 close to the gate electrode 7 is adjusted to have arelatively low impurity concentration, and the n type offset drainregion 13 spaced from the gate electrode 7 is adjusted to have arelatively high impurity concentration. The conventional one does nothave such a double offset structure. As illustrated in this diagram, thepower MOSFET according to this Embodiment has reduced feedbackcapacitance (Cgd) and reduced on resistance (Ron) compared with theconventional power MOSFET.

As a result, as illustrated in FIG. 18, it has been revealed by actualmeasurement performed by the present inventors that the power addedefficiency (PAE) of an amplifier circuit using the power MOSFET of thisembodiment is improved by about 2% over that of the amplifier circuitusing the conventional power MOSFET.

FIG. 19 is a perspective view of an RF power module on which asemiconductor chip 1A having an amplifier circuit using the power MOSFETof this Embodiment has been mounted.

The semiconductor chip 1A is installed in a cavity while the backside ofthe substrate 1 is disposed opposite to the main surface of a modulesubstrate 50. The semiconductor chip 1A is electrically connected to atransmission line 52 via an Au wire 51. In addition to the semiconductorchip 1A, a condenser 53 for impedance matching is connected to thetransmission line 52. The Au wire 51 functions as an inductor, while thetransmission line 52 functions as an inductor for impedance matching.The source rear electrode 31 formed over the backside of the substrate 1is soldered onto an electrode 54 for chip mounting. The electrode 54 iselectrically and thermally joined with a GND electrode 56 on thebackside of the module substrate 50 via a thermal via 55 in the modulesubstrate 50. The main surface of the module substrate 50 is coveredwith a mold resin 57 and the semiconductor chip 1A and condenser 53 aresealed therewith.

Embodiment 2

In the power MOSFET according to Embodiment 1, a p type sinker layer 4is formed by embedding a heavily doped p type polysilicon film inside ofthe trench 3. The p type sinker layer 4 formed by the present method isadvantageous over a sinker layer formed by ion implantation of animpurity, because the parasitic resistance of the former one can be madelower than that of the latter one.

However, formation of the sinker layer by embedding a conductive filminside of the trench requires the digging of a deep trench in thesubstrate 1 so that it imposes many restrictions on the process anddisturbs free disposal of the sinker layer. More specifically, for theformation of a sinker layer by embedding a trench with a conductivefilm, such as polysilicon film or metal film, a trench with a highaspect ratio is dug first, and, then, a conductive film is filled in thetrench without a space. The appearance of voids in the conductive filminside of the trench disturbs the planarization of the surface of thesubstrate, which presumably leads to defects, such as peeling of thefilm, owing to the step difference of the sinker layer in varioussubsequent film deposition steps. The width of the trench is thereforelimited by the depth of the trench or a conductive film depositionapparatus employed for the deposition.

With regard to the plane layout of the sinker layer, a rectangular shapewhich has a predetermined width at one side is most free from defects.In such a shape, the conductive film is embedded uniformly, because thetrench has no regions that are different in width.

As illustrated in FIG. 21, on the other hand, when rectangular trenchescross in an X shape or T shape, the trenches become wider at theintersection thereof than at the other portion of the trenches. Thetrench may have a larger width at this intersection so that there is apossibility that the conductive film is not uniformly embedded in thetrench and defects such as peeling of the film occur, as describedabove. If there is a conductive film deposition apparatus that iscapable of embedding a conductive film uniformly even in such a widenedtrench, such an X-shaped or T-shaped layout can be adopted. Most of theapparatuses do not have such a capacity. Moreover, in consideration ofthe large trench depth of such a sinker layer, the width and distance ofthe trenches must be wider than the width of the contact hole to beconnected to the sinker layer.

In a finger-shaped power MOSFET, when the longitudinal direction of thesinker layer 4 is arranged in parallel to the longitudinal direction ofthe finger, as illustrated in FIG. 22, it is necessary to arrange aplurality of the sinker layers 4 and contact holes 22 a to be connectedthereto in a direction vertical to the finger in consideration of themask alignment margin and to widen both ends in the longitudinaldirection by a length corresponding to the mask overlay accuracy.

When the longitudinal direction of the sinker layer 4 is arrangedvertical to the longitudinal direction of the finger, as illustrated inFIG. 23, on the other hand, not the sinker layer 4 and contact hole 22a, but only the sinker layer 4 is widened by a length corresponding tothe mask overlay accuracy. Compared with the layout of FIG. 22, the areaof the sinker layer 4 is wider in the layout of FIG. 23, resulting in areduction in the parasitic resistance of the sinker layer 4. FIG. 24illustrates a comparison in the area of the sinker layer 4 as a functionof the cell pitch between the parallel layout of FIG. 22 and thevertical layout of FIG. 23 when the width of one side of the sinkerlayer 4 is 0.4 μm and the distance between two adjacent sinker layers 4is 0.4 μm. As is apparent from this graph, the area of the sinker layer4 is greater in the vertical layout (solid line) than in the parallellayout (dashed line), so that in the former case, the parasiticresistance can be reduced.

In the layout of the sinker layer 4, as illustrated in FIG. 22, owing toa discrete optimum cell pitch, disposal of the sinker layers 4 islimited. The width of one side of the sinker layer 4 is 0.4 μm and thedistance between two adjacent sinker layers 4 is 0.4 μm. For example,assuming that the cell pitch when one sinker layer 4 is disposedadjacent to the source and parallel to the longitudinal direction of thefinger is 3.5 μm, the cell pitch becomes 3.9 μm by an increase in thenumber of sinker layers to two.

In the layout of the sinker layer 4, as illustrated in FIG. 23, on theother hand, the length of the sinker layer 4 in the longitudinaldirection may be changed, depending on the cell pitch. It is thereforepossible to change the cell pitch relatively freely in view of thesurrounding conditions.

FIG. 25 is a plane layout of the sinker layer 4 when disposed in ameander form, while FIG. 26 is a plane layout of the sinker layer 4 whendisposed in a mesh form. In these layouts, a conductive film cannot beembedded so easily as in the layout of FIG. 23, because of a partialdifference in the width of the sinker layer 4. Since the area of thesinker layer 4 is larger than that in FIG. 23, however, the parasiticresistance can be reduced further. Moreover, a change in the cell pitchcan be carried out relatively easily.

Embodiment 3

FIG. 27 is a fragmentary cross-sectional view of a substrate 1illustrating a power MOSFET according to this Embodiment. In the nchannel type power MOSFET of this Embodiment, a gate electrode 7 iscomposed only of an n type polysilicon film, a long trench 32 is formedin an insulating film over the gate electrode 7, and the gate electrode7 is shunted by a plug 23 embedded inside of this long trench 32. Theplug 23 is, similar to the plug 23 embedded inside of the contact hole22, made of a metal film composed mainly of a W film. The long trench 32has a length almost equal to that of the gate electrode 7 and extends inparallel to the gate electrode 7.

The long trench 32 over the gate electrode 7 is formed in the followingmanner. After deposition of a silicon oxide film 21 over the powerMOSFET, the silicon oxide film 21 is dry etched using a photoresist filmas a mask. Etching is once terminated on the surface of the siliconnitride film 21 covering the upper portion of the gate electrode 7.Then, after dry etching of the silicon nitride film 21, the siliconoxide film (cap insulating film 8) below the silicon nitride film 21 isetched, whereby the long trench 32 reaching the surface of the gateelectrode 7 is formed. In such a manner, by once terminating etching onthe surface of the silicon nitride film 21 covering the upper portion ofthe gate electrode 7 and then etching the cap insulating film 8, aninconvenience such as penetration of the bottom portion of the longtrench 32 through the substrate 1 can be prevented even if the width ofthe long trench 32 is made greater than the gate length of the gateelectrode 7. This makes it possible to adjust the width of the longtrench 32 so that it is wider than the gate length of the gate electrode7 and to reduce the contact resistance between the plug 23 to beembedded in the long trench 32 and the gate electrode 7. The plug 23 canbe embedded inside of the long trench 32 simultaneously with theembedding of the plug 23 in the contact hole 22 over the source anddrain.

By shunting the gate electrode 7 with a low resistance plug 23 made of ametal film embedded in the long trench 32 over the gate electrode 7 andthereby reducing its sheet resistance, the provision of a first-level orsecond-level Al alloy interconnect for shunting the gate electrode 7becomes unnecessary. This makes it possible to eliminate a wiring regionof an Al alloy interconnect for shunting, whereby the size of thesemiconductor chip 1A on which the power MOSFET is to be formed can bereduced and a size reduction of the RF power module can be promoted.

Moreover, by constituting the gate electrode 7 only from a singlepolysilicon film, the gate electrode of the p channel power MOSFET canbe constituted from a p type polysilicon film. This makes it possible toform the p channel type power MOSFET as a surface channel type whichhardly causes short channel effects, so that an improvement in theperformance of the p channel type power MOSFET by miniaturization can bepromoted.

Furthermore, by constituting the gate electrode 7 from a singlepolysilicon film, a resistor 33 can be formed in the same semiconductorchip 1A by using this single polysilicon film. In addition, the gateelectrode 7 composed of a single polysilicon film can be used as oneelectrode of an MIM (Metal Insulator Metal) type capacitor. As describedabove, by constituting the gate electrode 7 from a single polysiliconfilm and shunting the gate electrode 7 with the plug 23 embedded in thelong trench 32 over the gate electrode 7, it is possible to form theresistor 33 or capacitor easily within the same semiconductor chip 1Aand, therefore, to promote integration of all of the functions of the RFpower module in one chip. In addition, this facilitates theinterconnection layout of the module substrate 50 on which thesemiconductor chip 1A is mounted, so that improvement of power addedefficiency and size reduction of the RF power module can be promoted.

The invention completed by the present inventors has been describedspecifically based on some embodiments. However, it should be borne inmind that the present invention is not limited to or by the specificallydescribed embodiments, but it can be modified within an extent notdeparting from the scope of the invention.

The power MOSFET according to the invention is suited for use in an RFpower amplifier for mobile phones.

1. A semiconductor device including a MISFET, comprising: asemiconductor substrate having a front surface and a rear surfaceopposite to the front surface; a semiconductor layer formed over thefront surface of the semiconductor substrate; a gate insulating film ofthe MISFET formed over the semiconductor layer; a gate electrode of theMISFET formed over the gate insulating film; a first impurity regionformed in the semiconductor layer and constituting a drain region of theMISFET or a source region of the MISFET; a second impurity region formedin the semiconductor layer and constituting a drain region of the MISFETor a source region of the MISFET; and a rear electrode formed on therear surface of the semiconductor substrate, wherein a groove is formedin the semiconductor layer and the semiconductor substrate, wherein aconductive film is embedded into the groove, wherein the first impurityregion is electrically connected with the rear electrode via theconductive film, wherein, in a plane view, a shape of the gate electrodeis longer in a first direction than in a second direction which issubstantially perpendicular to the first direction, and wherein, in theplane view, a shape of the groove is longer in the first direction thanin the second direction.
 2. A semiconductor device according to theclaim 1, further comprising: an interlayer insulating film formed overthe semiconductor layer, the conductive film and the MISFET; a firstplug formed in the interlayer insulating film and connected to theconductive film; a second plug formed in the interlayer insulating filmand connected to the first impurity region; and a wiring formed over theinterlayer insulating film and connected to the first and second plugs.3. A semiconductor device according to the claim 2, wherein a pluralityof the first plugs are formed in the interlayer insulating film and areconnected to the conductive film.
 4. A semiconductor device according tothe claim 3, wherein, in the plane view, a shape of each the first plugsis longer in the second direction than in the first direction.
 5. Asemiconductor device according to the claim 4, wherein, in the planeview, a shape of the second plugs is longer in the first direction thanin the second direction.
 6. A semiconductor device according to theclaim 3, wherein, in the plane view, a shape of the second plugs islonger in the first direction than in the second direction.
 7. Asemiconductor device according to the claim 1, wherein the conductivefilm includes a polysilicon film.
 8. A semiconductor device according tothe claim 1, wherein the conductive film includes a metal film.
 9. Asemiconductor device according to the claim 1, wherein the MISFET isconfigured to be used for a power amplifier circuit.
 10. A semiconductordevice according to the claim 1, further comprising a plurality of theMISFETs, wherein, in the second direction, first and second MISFETs areabutted to each other in the second direction, and wherein, in thesecond direction, the conductive film is arranged between the firstimpurity region of the first MISFET and the first impurity region of thesecond MISFET.
 11. A semiconductor device including a MISFET,comprising: a semiconductor substrate structure having a front surfaceand a rear surface opposite to the front surface; a gate insulating filmof the MISFET formed over the front surface of the semiconductorsubstrate structure; a gate electrode of the MISFET formed over the gateinsulating film; a first impurity region formed in the semiconductorsubstrate structure and constituting a drain region of the MISFET or asource region of the MISFET; a second impurity region formed in thesemiconductor substrate structure and constituting a drain region of theMISFET or a source region of the MISFET; and a rear electrode formed onthe rear surface of the semiconductor substrate structure, wherein agroove is formed in the semiconductor substrate structure, wherein aconductive film is embedded into the groove, wherein the first impurityregion is electrically connected with the rear electrode via theconductive film, wherein, in a plane view, a shape of the gate electrodeis longer in a first direction than in a second direction which issubstantially perpendicular to the first direction, and wherein, in theplane view, a shape of the groove is longer in the first direction thanin the second direction.
 12. A semiconductor device according to theclaim 11, further comprising: an interlayer insulating film formed overthe semiconductor substrate structure, the conductive film and theMISFET; a first plug formed in the interlayer insulating film andconnected to the conductive film; a second plug formed in the interlayerinsulating film and connected to the first impurity region; and a wiringformed over the interlayer insulating film and connected to the firstand second plugs.
 13. A semiconductor device according to the claim 12,wherein a plurality of the first plugs are formed in the interlayerinsulating film and are connected to the conductive film.
 14. Asemiconductor device according to the claim 13, wherein, in the planeview, a shape of each the first plugs is longer in the second directionthan in the first direction.
 15. A semiconductor device according to theclaim 14, wherein, in the plane view, a shape of the second plugs islonger in the first direction than in the second direction.
 16. Asemiconductor device according to the claim 13, wherein, in the planeview, a shape of the second plugs is longer in the first direction thanin the second direction.
 17. A semiconductor device according to theclaim 11, wherein the conductive film includes a polysilicon film.
 18. Asemiconductor device according to the claim 11, wherein the conductivefilm includes a metal film.
 19. A semiconductor device according to theclaim 11, wherein the MISFET is configured to be used for a poweramplifier circuit.
 20. A semiconductor device according to the claim 11,further comprising a plurality of the MISFETs, wherein, in the seconddirection, first and second MISFETs are abutted to each other in thesecond direction, and wherein, in the second direction, the conductivefilm is arranged between the first impurity region of the first MISFETand the first impurity region of the second MISFET.